Systems and Methods for Multi-View NonLinear Optical Imaging for Improved Signal-to-Noise Ratio and Resolution in Point Scanning Multi-Photon Microscopy
Technology
E-229-2015
Patent ID
E-229-2015-0-US-01
Country
US
Application Type
Patent Status
Abandoned
Patent Number
Publication Number
Application Number
62/210,153
IC
NIBIB
Date Filed
Date Issued
Patent PDF